2016 International Reliability Physics Symposium, IRPS 2016

Uren, M. J. (Participant)

Activity: Participating in or organising an event typesInvited talk

Description

Reliability Differences Between RF and Power Switching GaN Power Transistors
Period17 Apr 201621 Apr 2016
Event typeConference
LocationPasadena, United States
Degree of RecognitionInternational