Arkansas Materials Characterisation Facility, University of Arkansas

Description

BGER - Prototyping Organic Semiconductor Circuits via High-Speed Atomic Force Nanolithography

Across two week-long research trips to the new Materials Characterisation Facility at the University of Arkansas Dr Picco and Mr Brown successfully completed two projects: the installation of a high-speed atomic force microscope (HSAFM) and the chemical characterisation of novel organic semiconductor circuit prototypes. The HSAFM is the only other copy of the world-leading instrument that Dr Picco has pioneered at Bristol and complements the excellent facilities at Arkansas, where it has already begun to spark whole new collaborations and research proposals. The prototype circuits patterned by Mr Ben Brown are created using the high-resolution capabilities of the AFM and the Materials Characterisation Facility was instrumental in identifying the exact chemical reactions that take place during this nanolithographic process.

Period	9 Feb 2013 → 31 Mar 2013
Visiting	Arkansas Materials Characterisation Facility, University of Arkansas