B. Rackauskas et al. EDL 2018


Research Output

  • 1 Article (Academic Journal)

The impact of Ti/Al contacts on AlGaN/GaN HEMT vertical leakage and breakdown

Rackauskas, B., Uren, M. J., Stoffels, S., Zhao, M., Bakeroot, B., Decoutere, S. & Kuball, M., Oct 2018, In : IEEE Electron Device Letters. 39, 10, p. 1580-1583 3 p., 4.

Research output: Contribution to journalArticle (Academic Journal)

Open Access
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