B. Rackauskas et at. MER 2019

Dataset

Description

Accompanying data for B. Rackauskas et at. MER 2019
Date made available1 Mar 2019
PublisherUniversity of Bristol

Research Output

  • 1 Article (Academic Journal)

Reliability and lifetime estimations of GaN-on-GaN vertical pn diodes

Rackauskas, B., Uren, M., Kachi, T. & Kuball, M., Apr 2019, In : Microelectronics Reliability. 95, p. 48-51 4 p.

Research output: Contribution to journalArticle (Academic Journal)

Open Access
File
  • 2 Citations (Scopus)
    189 Downloads (Pure)

    Cite this

    Pomeroy, J. (Creator), Rackauskas, B. (Creator), Kuball, M. (Data Manager) (1 Mar 2019). B. Rackauskas et at. MER 2019. University of Bristol. 10.5523/bris.7qywrneti4ig2j2png6cvpf3m