B. Rackauskas et at. MER 2019

James W Pomeroy (Creator)
Ben Rackauskas (Creator)
Martin H H Kuball (Data Manager)

Dataset

Description

Accompanying data for B. Rackauskas et at. MER 2019

Date made available	1 Mar 2019
Publisher	University of Bristol

Contact

[email protected]

DOI
10.5523/bris.7qywrneti4ig2j2png6cvpf3m

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1 Article (Academic Journal)

Reliability and lifetime estimations of GaN-on-GaN vertical pn diodes
Rackauskas, B., Uren, M., Kachi, T. & Kuball, M., Apr 2019, In: Microelectronics Reliability. 95, p. 48-51 4 p.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

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12 Citations (Scopus)

408 Downloads (Pure)

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