C. Middleton et al. APEX 2018



Research group data, Center for Device Thermography and Reliability, diamond,microwave and power semiconductor electronic devices and materials.
Date made available15 Jan 2019
PublisherUniversity of Bristol


  • Photoluminescence
  • Microwave power
  • Diamond
  • GaN

Research Output

  • 1 Article (Academic Journal)

Impact of thinning the GaN buffer and interface layer on thermal and electrical performance in GaN-on-diamond electronic devices

Middleton, C., Chandrasekar, H., Singh, M., Pomeroy, J. W., Uren, M. J., Francis, D. & Kuball, M., 1 Feb 2019, In : Applied Physics Express. 12, 2, 024003.

Research output: Contribution to journalArticle (Academic Journal)

  • 2 Citations (Scopus)

    Cite this

    Sarua, A. (Creator), Kuball, M. (Creator), Pomeroy, J. (Creator), Uren, M. (Creator), Karboyan, S. (Creator), Zhou, Y. (Creator), Manikant, M. (Creator), Rackauskas, B. (Creator), Middleton, C. (Creator), Oner, B. (Creator), Dalcanale, S. (Creator), Gucmann, F. (Creator), Yuan, C. (Creator), Yang, F. (Creator), Waller, W. (Creator), Moule, T. (Creator), Cao, Y. (Creator), Wohlfahrt, M. (Creator), Field, D. (Creator), Wach, F. (Creator) (15 Jan 2019). C. Middleton et al. APEX 2018. University of Bristol. 10.5523/bris.kd7obfjawia22pwia2jtpg3aw