Research output per year
Research output per year
B.Sc.(Lond.), Ph.D.(Cantab.), F.Inst.P., F.R.S.
BS8 1TL
My past research has been based largely on transmission electron microscopy (TEM) and (convergent beam) electron diffraction.
However, I have recently embarked on a completely new activity concerned with the study of point defects and their complexes in wide-band-gap semiconductors, such as silicon carbide, diamond, and cubic boron carbide.I aim to understand, exploit, and develop the extremely sensitive method of low-temperature (~7K) photoluminescence microscopy for non-destructive evaluation and identification of defects in these materials.
Considerable international and national collaboration is involved. The defects may be grown-in or created by energy-selected irradiation of specimens in a specially adapted 300 kV TEM. The materials are of considerable interest for future applications in high-power, high-temperature, and high-frequency electronics and also for quantum information processing.
Research output: Contribution to journal › Article (Academic Journal) › peer-review
Research output: Contribution to journal › Article (Academic Journal) › peer-review
Research output: Contribution to journal › Article (Academic Journal) › peer-review
Steeds, J. W. (Principal Investigator)
1/08/02 → 1/10/05
Project: Research
Steeds, J. W. (Principal Investigator)
1/02/99 → 1/02/02
Project: Research
Steeds, J. W. (Principal Investigator)
1/09/97 → 1/09/99
Project: Research