Renze Yu

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Emailrenze.yubristol.acuk, kz21517bristol.acuk

BS2 8BS

6 Article (Academic Journal)
4 Conference Contribution (Conference Proceeding)

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2023
Degradation Analysis of Planar, Symmetrical and Asymmetrical Trench SiC MOSFETs Under Repetitive Short Circuit Impulses
Yu, R., Jahdi, S., Mellor, P., Liu, L., Yang, J., Shen, C., Alatise, O. & Ortiz-Gonzalez, J., 28 Jun 2023, In: IEEE Transactions on Power Electronics. 38, 9, p. 10933-10946 14 p.
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4 Citations (Scopus)

167 Downloads (Pure)
Electrothermal power cycling of GaN and SiC cascode devices
Gunaydin, Y., Jahdi, S., Yu, R., Yuan, X., Alatise, O. & Ortiz Gonzalez, J., 3 Nov 2023, In: Microelectronics Reliability. 150, 115117.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

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44 Downloads (Pure)
Electrothermal Power Cycling to Failure of Discrete Planar, Symmetrical Double-Trench and Asymmetrical Trench SiC MOSFETs
Yang, J., Jahdi, S., Yu, R. & Stark, B., 8 Nov 2023, In: IEEE Open Journal of Power Electronics. 4, p. 887 - 899 13 p.
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Measurements and Review of Failure Mechanisms and Reliability Constraints of 4H-SiC Power MOSFETs Under Short Circuit Events
Yu, R., Jahdi, S., Alatise, O., Ortiz-Gonzalez, J., Munagala, S. P., Simpson, N. & Mellor, P., 1 Dec 2023, In: IEEE Transactions on Device and Materials Reliability. 23, 4, p. 544 - 563 20 p.
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1 Citation (Scopus)

118 Downloads (Pure)
2022
FEM-based analysis of avalanche ruggedness of high voltage SiC Merged-PiN-Schottky and Junction-Barrier-Schottky diodes
Shen, C., Yu, R., Jahdi, S., Mellor, P. H., Munagala, S. P., Hopkins, A. N., Simpson, N., Ortiz-Gonzalez, J. & Alatise, O., 1 Nov 2022, In: Microelectronics Reliability. 138, 11 p., 114686.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

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Unclamped inductive stressing of GaN and SiC Cascode power devices to failure at elevated temperatures
Gunaydin, Y., Jahdi, S., Yuan, X., Yu, R., Shen, C., Munagala, S. P., Hopkins, A. N., Simpson, N., Hosseinzadehlish, M., Ortiz-Gonzalez, J. & Alatise, O., 1 Nov 2022, In: Microelectronics Reliability. 138, 7 p., 114711.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

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2 Citations (Scopus)

57 Downloads (Pure)

Mr Renze Yu

Research output

Search results

Degradation Analysis of Planar, Symmetrical and Asymmetrical Trench SiC MOSFETs Under Repetitive Short Circuit Impulses

Electrothermal power cycling of GaN and SiC cascode devices

Electrothermal Power Cycling to Failure of Discrete Planar, Symmetrical Double-Trench and Asymmetrical Trench SiC MOSFETs

Measurements and Review of Failure Mechanisms and Reliability Constraints of 4H-SiC Power MOSFETs Under Short Circuit Events

FEM-based analysis of avalanche ruggedness of high voltage SiC Merged-PiN-Schottky and Junction-Barrier-Schottky diodes

Unclamped inductive stressing of GaN and SiC Cascode power devices to failure at elevated temperatures