GUIDED ACCESS TO HIGH-SPEED CONTACT ATOMIC FORCE MICROSCOPY AND PHOTONIC FORCE MICROSCOPY AT THE NANOSCIENCE AND QUANTUM INFORMATION CENTRE

Hoerber, J K H (Principal Investigator)

Status	Finished
Effective start/end date	1/01/09 → 1/07/13

1 Article (Academic Journal)

Error mapping of high-speed AFM systems
Klapetek, P., Picco, L., Payton, O., Yacoot, A. & Miles, M., Feb 2013, In: Measurement Science and Technology. 24, 2, 7 p., 025006.
Research output: Contribution to journal › Article (Academic Journal) › peer-review
22 Citations (Scopus)