Novel Sub-Threshold Methodologies for GaN Electronic Devices: A Study of Device Reliability and Failure Mechanisms

Kuball, Martin H H (Principal Investigator)

School of Physics

Status	Finished
Effective start/end date	1/04/11 → 1/11/15

Research Groups and Themes

CDTR

7 Article (Academic Journal)
1 Conference Contribution (Conference Proceeding)

Contactless thermal boundary resistance measurement of GaN-on-diamond wafers
Pomeroy, J. W., Simon, R. B., Sun, H., Francis, D., Faili, F., Twitchen, D. J. & Kuball, M., 1 Oct 2014, In: IEEE Electron Device Letters. 35, 10, p. 1007-1009 3 p., 6892957.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

Open Access
File
60 Citations (Scopus)

816 Downloads (Pure)
Diamond micro-Raman thermometers for accurate gate temperature measurements
Simon, R. B., Pomeroy, J. W. & Kuball, M. H. H., May 2014, In: Applied Physics Letters. 104, 21, 4 p., 213503.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

Open Access
File
36 Citations (Scopus)

538 Downloads (Pure)
GaN Buffer Design: Electrical Characterization and Prediction of the Effect of Deep Level Centers in GaN/AIGaN HEMTs
Silvestri, M., Uren, M. J., Marcon, D. & Kuball, M., 2013, Proceedings of 2013 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH): May 13th - 16th 2013, New Orleans, Louisiana, USA. CS Mantech, p. 195-197 3 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
2 Citations (Scopus)

145 Downloads (Pure)