NOVEL TIME-RESOLVED THERMAL IMAGING:AIGAN/GAN HETEROSTRUCTURE FILED EFFECT TRANSISTORS

Project Details

StatusFinished
Effective start/end date1/07/061/04/10

Research Output

  • 1 Article (Academic Journal)

Time-resolved temperature measurement of AlGaN/GaN electronic devices using micro-Raman spectroscopy

Kuball, M., Riedel, G., Pomeroy, JW., Sarua, A., Uren, MJ., Martin, T., Hilton, KP., Maclean, JO. & Wallis, DJ., Feb 2007, In : IEEE Electron Device Letters. 28 (2), p. 86 - 89 4 p.

Research output: Contribution to journalArticle (Academic Journal)

  • 97 Citations (Scopus)