THERMAL IMAGING OF ACTIVE A1GAN/GAN FIELD EFFECT TRANSISTORS USING MICRO RAMAN SPECTROSCOPY

Status	Finished
Effective start/end date	19/03/04 → 19/03/07

High-Resolution Raman Temperature Measurements in GaAs p-HEMT Multifinger Devices
Sarua, A., Bullen, A., Haynes, M. & Kuball, M., Aug 2007, In: IEEE Transactions on Electron Devices. 54(8), p. 1838 - 1842 5 p.
Research output: Contribution to journal › Article (Academic Journal) › peer-review
32 Citations (Scopus)
Thermal Boundary Resistance Between GaN and Substrate in AlGaN/GaN Electronic Devices
Sarua, A., Ji, H., Hilton, K., Wallis, D., Uren, M., Martin, T. & Kuball, M., Dec 2007, In: IEEE Transactions on Electron Devices. 54(12), p. 3152 - 3158 7 p.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

291 Citations (Scopus)
Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures
Sarua, A., Ji, H., Kuball, M., Uren, M., Martin, T., Hilton, K. & Balmer, R., Oct 2006, In: IEEE Transactions on Electron Devices. 53 (10), p. 2438 - 2447 10 p.
Research output: Contribution to journal › Article (Academic Journal) › peer-review
265 Citations (Scopus)

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