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Yield and reliability enhancement techniques for novel memory devices

  • Pradhan, Dhiraj K (Principal Investigator)

Project Details

StatusFinished
Effective start/end date24/08/12 → 24/12/15

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Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.
  • 2T2M memristor based TCAM cell for low power applications

    Yang, Y., Mathew, J., Ottavi, M., Pontarelli, S. & Pradhan, D. K., 17 Jun 2015, Proceedings - 2015 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015. Institute of Electrical and Electronics Engineers (IEEE), 7127379

    Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

    5 Citations (Scopus)
  • A novel memristor-based hardware security primitive

    Mathew, J., Chakraborty, R. S., Sahoo, D. P., Yang, Y. & Pradhan, D. K., 1 Apr 2015, In: ACM Transactions on Embedded Computing Systems. 14, 3, 60.

    Research output: Contribution to journal › Article (Academic Journal) › peer-review

    33 Citations (Scopus)
  • A novel memristor based physically unclonable function

    Mathew, J., Chakraborty, R. S., Sahoo, D. P., Yang, Y. & Pradhan, D. K., 1 Sept 2015, In: Integration, the VLSI Journal archive. 51, p. 37-45 9 p., 1124.

    Research output: Contribution to journal › Article (Academic Journal) › peer-review

    24 Citations (Scopus)