Abstract
We have employed a novel fibre‐based confocal microscope to measure the magneto‐photoluminescence of single InGaAs quantum dots at arbitrary angles, of tilt and rotation, with respect to magnetic fields of up to 10 T. Modelling the bright and dark exciton emissions as a function of the field strength and angle using the spin Hamiltonian derived by Van Kesteren et al. gives access to a unique set of 9 parameters (electron and hole g‐factors and exchange terms) for the 3D fine structure of each quantum dot. We find strong asymmetries for the in‐plane to growth direction tensor components, but little to no significant in‐plane variations in our sample. Interestingly, anti‐crossings at intermediate tilt angles provide a direct measure of the in‐plane electron and hole g‐factor.
Translated title of the contribution | 3D g-Factor Mapping: Fine Structure Effects in Single Quantum Dots |
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Original language | English |
Title of host publication | 30th International Conference on the Physics of Semiconductors |
Publisher | American Institute of Physics (AIP) |
Pages | 441 - 442 |
Number of pages | 2 |
Volume | 1399 |
ISBN (Print) | 9780735410022 |
DOIs | |
Publication status | Published - 2010 |
Bibliographical note
Name and Venue of Event: Seoul, KoreaConference Proceedings/Title of Journal: AIP Conference Proceedings
Conference Organiser: American Institute of Physics