3D localization microscopy and 4D localization microscopy and tracking methods and systems

Mark B Cannell; C Soeller; David Beddeley

3D localization microscopy and 4D localization microscopy and tracking methods and systems

Mark B Cannell (Inventor), C Soeller (Inventor), David Beddeley (Inventor)

School of Physiology, Pharmacology & Neuroscience

Research output: Patent

Abstract

A 3D localization microscopy system, 4D localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.

Original language	English
Patent number	US10571674B2
Priority date	24/10/10
Filing date	28/03/18
Publication status	Published - 25 Feb 2020

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title = "3D localization microscopy and 4D localization microscopy and tracking methods and systems",

abstract = "A 3D localization microscopy system, 4D localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.",

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AU - Cannell, Mark B

AU - Soeller, C

AU - Beddeley, David

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N2 - A 3D localization microscopy system, 4D localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.

AB - A 3D localization microscopy system, 4D localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.

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M1 - US10571674B2

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3D localization microscopy and 4D localization microscopy and tracking methods and systems

Abstract

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Practical aspects of localization microscopy

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