Translated title of the contribution | A Combined DOE-ILP Based Power and Read Stability Optimization in Nano-CMOS SRAM |
---|---|
Original language | English |
Title of host publication | IEEE International Conference on VLSI Design (VLSID) |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Publication status | Published - 2010 |
Bibliographical note
Other page information: -Conference Proceedings/Title of Journal: IEEE International Conference on VLSI Design (VLSID)
Other identifier: 2001147