A Framework for Developing Robust Machine Learning Models in Harsh Environments: A Review of CNN Design Choices

William Dennis, James Pope

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Abstract

Machine Learning algorithms are envisioned to be used in harsh and/or safety critical environments such as self-driving cars, aerospace, and nuclear sites where the effects of radiation can cause errors in electronics known as Single Event Effects (SEEs). The effect of SEEs on machine learning models, such as neural networks composed of millions of parameters, is currently unknown. Understanding the models in terms of robustness and reliability is essential for their use in these environments. To facilitate this understanding, we propose a novel framework to simulate SEEs during model training and inference. Using the framework we investigate the robustness of the Convolutional Neural Network (CNN) architecture with dropout, regularisation and activation functions under different error models. Two new activation functions are suggested that decrease error by up to 40\% compared to ReLU. We also investigate an alternative pooling layer that can provide model robustness with a 16\% decrease in error with ReLU.
Original languageEnglish
Title of host publicationProceedings of the 17th International Conference on Agents and Artificial Intelligence
Subtitle of host publicationICAART
PublisherSciTePress
Publication statusAccepted/In press - 1 Jan 2025
EventICAART-2025 : 17th International Conference on Agents and Artificial Intelligence - Porto, Portugal
Duration: 23 Feb 202525 Feb 2025
Conference number: 17
https://icaart.scitevents.org/Websites.aspx

Conference

ConferenceICAART-2025 : 17th International Conference on Agents and Artificial Intelligence
Abbreviated titleICAART
Country/TerritoryPortugal
CityPorto
Period23/02/2525/02/25
Internet address

Keywords

  • Robust Machine Learning
  • Fault Tolerance
  • Harsh Environments
  • Convolutional Neural Network
  • Single Event Effects

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