A full field DC potential drop calibration for an asymmetrically cracked M(T) specimen

PC Mckeighan, W Zhu, DJ Smith

Research output: Contribution to journal › Article (Academic Journal) › peer-review

5 Citations (Scopus)

Translated title of the contribution	A full field DC potential drop calibration for an asymmetrically cracked M(T) specimen
Original language	English
Pages (from-to)	102 - 110
Journal	Journal of Testing and Evaluation
Volume	23
Publication status	Published - 1995

Cite this

@article{090d8788212040a1bd951fdd87e01b46,

title = "A full field DC potential drop calibration for an asymmetrically cracked M(T) specimen",

author = "PC Mckeighan and W Zhu and DJ Smith",

year = "1995",

language = "English",

volume = "23",

pages = "102 -- 110",

journal = "Journal of Testing and Evaluation",

issn = "0090-3973",

publisher = "American Society for Testing and Materials",

}