A full field DC potential drop calibration for an asymmetrically cracked M(T) specimen

PC Mckeighan, W Zhu, DJ Smith

Research output: Contribution to journalArticle (Academic Journal)peer-review

5 Citations (Scopus)
Translated title of the contributionA full field DC potential drop calibration for an asymmetrically cracked M(T) specimen
Original languageEnglish
Pages (from-to)102 - 110
JournalJournal of Testing and Evaluation
Volume23
Publication statusPublished - 1995

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