A genetic two-factor model of the covariation among a subset of Multidimensional Aptitude Battery and WAIS-R subtests

M Luciano, MJ Wright, GM Geffen, LB Geffen, GA Smith, D Evans, NG Martin

Research output: Contribution to journalArticle (Academic Journal)

18 Citations (Scopus)
Translated title of the contributionA genetic two-factor model of the covariation among a subset of Multidimensional Aptitude Battery and WAIS-R subtests
Original languageEnglish
Pages (from-to)589 - 605
Number of pages17
JournalIntelligence
Volume31 (6)
DOIs
Publication statusPublished - Nov 2003

Bibliographical note

Publisher: Elsevier

Cite this

Luciano, M., Wright, MJ., Geffen, GM., Geffen, LB., Smith, GA., Evans, D., & Martin, NG. (2003). A genetic two-factor model of the covariation among a subset of Multidimensional Aptitude Battery and WAIS-R subtests. Intelligence, 31 (6), 589 - 605. https://doi.org/10.1016/S0160-2896(03)00057-6