A Hamming Distance Based Test Pattern Generator With Improved Fault Coverage

D Pradhan; D Kagaris

A Hamming Distance Based Test Pattern Generator With Improved Fault Coverage

D Pradhan, D Kagaris

Department of Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

9 Citations (Scopus)

Abstract

This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non?binary error detecting codes, formulated over an extension ﬁeld of GF(2δ), δ > 1. The resulting generator provides a guaranteed Hamming distance between successive test patterns, resulting in shorter test lengths. As an additional advantage, the proposed TPG has the intrinsic ability to detect 1?bit errors in the TPG itself. Detailed design methodology and experimental results are presented. The results presented here also have implications in algebraic coding theory in that they may lead to new coding techniques for test pattern generation.

Translated title of the contribution	A Hamming Distance Based Test Pattern Generator With Improved Fault Coverage
Original language	English
Title of host publication	Unknown
Publication status	Published - Jun 2005

Bibliographical note

Conference Proceedings/Title of Journal: IEEE International On-Line Testing Symposium

Access to Document

http://www.cs.bris.ac.uk/Publications/pub_info.jsp?id=2000312

Fingerprint Dive into the research topics of 'A Hamming Distance Based Test Pattern Generator With Improved Fault Coverage'. Together they form a unique fingerprint.

Cite this

@inproceedings{a6423d8884de4c3187f2ae75e942e38c,

title = "A Hamming Distance Based Test Pattern Generator With Improved Fault Coverage",

abstract = "This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non?binary error detecting codes, formulated over an extension ﬁeld of GF(2δ), δ > 1. The resulting generator provides a guaranteed Hamming distance between successive test patterns, resulting in shorter test lengths. As an additional advantage, the proposed TPG has the intrinsic ability to detect 1?bit errors in the TPG itself. Detailed design methodology and experimental results are presented. The results presented here also have implications in algebraic coding theory in that they may lead to new coding techniques for test pattern generation. ",

author = "D Pradhan and D Kagaris",

note = "Conference Proceedings/Title of Journal: IEEE International On-Line Testing Symposium",

year = "2005",

month = jun,

language = "English",

booktitle = "Unknown",

}

TY - GEN

T1 - A Hamming Distance Based Test Pattern Generator With Improved Fault Coverage

AU - Pradhan, D

AU - Kagaris, D

N1 - Conference Proceedings/Title of Journal: IEEE International On-Line Testing Symposium

PY - 2005/6

Y1 - 2005/6

N2 - This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non?binary error detecting codes, formulated over an extension ﬁeld of GF(2δ), δ > 1. The resulting generator provides a guaranteed Hamming distance between successive test patterns, resulting in shorter test lengths. As an additional advantage, the proposed TPG has the intrinsic ability to detect 1?bit errors in the TPG itself. Detailed design methodology and experimental results are presented. The results presented here also have implications in algebraic coding theory in that they may lead to new coding techniques for test pattern generation.

AB - This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non?binary error detecting codes, formulated over an extension ﬁeld of GF(2δ), δ > 1. The resulting generator provides a guaranteed Hamming distance between successive test patterns, resulting in shorter test lengths. As an additional advantage, the proposed TPG has the intrinsic ability to detect 1?bit errors in the TPG itself. Detailed design methodology and experimental results are presented. The results presented here also have implications in algebraic coding theory in that they may lead to new coding techniques for test pattern generation.

M3 - Conference Contribution (Conference Proceeding)

BT - Unknown

ER -