Abstract
This paper proposes a new test pattern generator (TPG)
which is an enhancement of GLFSR (Galois LFSR). This design
is based on certain non?binary error detecting codes,
formulated over an extension field of GF(2δ), δ > 1. The
resulting generator provides a guaranteed Hamming distance
between successive test patterns, resulting in shorter
test lengths. As an additional advantage, the proposed TPG
has the intrinsic ability to detect 1?bit errors in the TPG itself.
Detailed design methodology and experimental results
are presented. The results presented here also have implications
in algebraic coding theory in that they may lead to
new coding techniques for test pattern generation.
Translated title of the contribution | A Hamming Distance Based Test Pattern Generator With Improved Fault Coverage |
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Original language | English |
Title of host publication | Unknown |
Publication status | Published - Jun 2005 |