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Abstract
This paper presents a novel low-complexity cross parity code, with a wide range of multiple bit error correction capability at a lower overhead, for improving the reliability in circuits over GF 2m. For an m input circuit, the proposed scheme can correct m≤ Dw≤ 3m/2-1 multiple error combinations out of all the possible 2m-1 errors, which is superior to many existing approaches. From the mathematical and practical evaluations, the best case error correction is m/2 bit errors. Tests on 80-bit parallel and, for the first time, on 163-bit Federal Information Processing Standard/National Institute of Standards and Technology (FIPS/NIST) standard word-level Galois field (GF) multipliers, suggest that it requires only 106% and 170% area overheads, respectively, which is lower than the existing approaches, while error injection-based behavioral analysis demonstrates its wider error correction capability.
Original language | English |
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Article number | 6876030 |
Pages (from-to) | 1448-1458 |
Number of pages | 11 |
Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Volume | 23 |
Issue number | 8 |
DOIs | |
Publication status | Published - 1 Aug 2015 |
Keywords
- Application specific integrated circuits (ASICs)
- Bose-Choudhury-Hocquenghem (BCH) code
- error correction circuit (ECC)
- Galois field (GF)
- multiple event upsets (MEUs)
- radiation hardening
- simple parity
- single event upsets (SEUs)
- VLSI
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Dive into the research topics of 'A Low-Complexity Multiple Error Correcting Architecture Using Novel Cross Parity Codes over GF(2m)'. Together they form a unique fingerprint.Projects
- 1 Finished
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PROCESS VARIATION AWARE SYNTHESIS OF NANO-CMOS CIRCUITS
Pradhan, D. K. (Principal Investigator)
1/10/09 → 1/03/13
Project: Research