A mechanical microscope: High speed atomic force microscopy

ADL Humphris, MJ Miles, JK Hobbs

Research output: Contribution to journalArticle (Academic Journal)peer-review

264 Citations (Scopus)

Abstract

An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s(-1) while maintaining nanometer resolution.
Translated title of the contributionA mechanical microscope: High speed atomic force microscopy
Original languageEnglish
Pages (from-to)1 - 3
Number of pages3
JournalApplied Physics Letters
Volume86 (3, 034106)
DOIs
Publication statusPublished - Jan 2005

Bibliographical note

Publisher: American Institute of Physics

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