Abstract
An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s(-1) while maintaining nanometer resolution.
| Translated title of the contribution | A mechanical microscope: High speed atomic force microscopy |
|---|---|
| Original language | English |
| Pages (from-to) | 1 - 3 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 86 (3, 034106) |
| DOIs | |
| Publication status | Published - Jan 2005 |