A mechanical microscope: High speed atomic force microscopy

ADL Humphris; MJ Miles; JK Hobbs

doi:10.1063/1.1855407

A mechanical microscope: High speed atomic force microscopy

ADL Humphris, MJ Miles, JK Hobbs

School of Physics

Research output: Contribution to journal › Article (Academic Journal) › peer-review

275 Citations (Scopus)

Abstract

An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s(-1) while maintaining nanometer resolution.

Translated title of the contribution	A mechanical microscope: High speed atomic force microscopy
Original language	English
Pages (from-to)	1 - 3
Number of pages	3
Journal	Applied Physics Letters
Volume	86 (3, 034106)
DOIs	https://doi.org/10.1063/1.1855407
Publication status	Published - Jan 2005

Bibliographical note

Publisher: American Institute of Physics

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10.1063/1.1855407

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@article{3fc17b71e670452480cba8f0049d79d7,

title = "A mechanical microscope: High speed atomic force microscopy",

abstract = "An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s(-1) while maintaining nanometer resolution.",

author = "ADL Humphris and MJ Miles and JK Hobbs",

note = "Publisher: American Institute of Physics",

year = "2005",

month = jan,

doi = "10.1063/1.1855407",

language = "English",

volume = "86 (3, 034106)",

pages = "1 -- 3",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics (AIP)",

}

TY - JOUR

T1 - A mechanical microscope: High speed atomic force microscopy

AU - Humphris, ADL

AU - Miles, MJ

AU - Hobbs, JK

N1 - Publisher: American Institute of Physics

PY - 2005/1

Y1 - 2005/1

N2 - An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s(-1) while maintaining nanometer resolution.

AB - An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s(-1) while maintaining nanometer resolution.

U2 - 10.1063/1.1855407

DO - 10.1063/1.1855407

M3 - Article (Academic Journal)

VL - 86 (3, 034106)

SP - 1

EP - 3

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

ER -

A mechanical microscope: High speed atomic force microscopy

Abstract

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