Abstract
An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s(-1) while maintaining nanometer resolution.
Translated title of the contribution | A mechanical microscope: High speed atomic force microscopy |
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Original language | English |
Pages (from-to) | 1 - 3 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 86 (3, 034106) |
DOIs | |
Publication status | Published - Jan 2005 |