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A Multi-mode Transverse Dynamic Force Microscope - Design, Identification and Control

Research output: Contribution to journalArticle

Original languageEnglish
Number of pages11
JournalIEEE Transactions on Industrial Electronics
Early online date2 Jul 2019
DOIs
DateAccepted/In press - 25 May 2019
DateE-pub ahead of print (current) - 2 Jul 2019

Abstract

The transverse dynamic force microscope (TDFM) and its shear force sensing principle permit true non-contact force detection in contrast to typical atomic force microscopes. The two TDFM measurement signals for the cantilever allow, in principle, two different scanning modes of which, in particular, the second presented here permits a full-scale non-contact scan. Previous research mainly focused on developing the sensing mechanism, whereas this work investigates the vertical axis dynamics for advanced robust closed-loop control. This paper presents a new TDFM digital control solution, built on field-programmable gate array (FPGA) equipment running at high implementation frequencies. The integrated control system allows the implementation of online customizable controllers, and raster-scans in two modes at very high detection bandwidth and nano-precision. Robust control algorithms are designed, implemented, and practically assessed. The two realized scanning modes are experimentally evaluated by imaging nano-spheres with known dimensions in wet conditions.

    Research areas

  • Scanning-probe microscopy, Control arithmetic optimization, Fixed-point implementation, Nano-precision control

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    Rights statement: This is the author accepted manuscript (AAM). The final published version (version of record) is available online via IEEE at https://ieeexplore.ieee.org/document/8753715. Please refer to any applicable terms of use of the publisher.

    Accepted author manuscript, 4.67 MB, PDF document

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