A near-far resistant algorithm to combat effects of fast fading in multi-user DS-CDMA systems

SSH Wijayasuriya, GH Norton, JP McGeehan

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

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Abstract

A sliding window decorrelating algorithm is developed. It is shown to be near-far resistant both in AWGN and fast fading environments. The algorithm is of particular relevance to base stations in multi-user DS-CDMA mobile radio networks, and is shown to alleviate the requirement for a complex power control algorithm to compensate for rapidly varying relative user energies
Translated title of the contributionA near-far resistant algorithm to combat effects of fast fading in multi-user DS-CDMA systems
Original languageEnglish
Title of host publicationInternational Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages645 - 649
ISBN (Print)0780308417
DOIs
Publication statusPublished - Oct 1992
Event3rd International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC) - Boston, MA, United States
Duration: 1 Oct 1992 → …

Conference

Conference3rd International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)
CountryUnited States
CityBoston, MA
Period1/10/92 → …

Bibliographical note

Conference Proceedings/Title of Journal: IEEE 3rd International Symposium on Personal, Indoor and Mobile Radio Communications, 1992 (PIMRC 1992)
Rose publication type: Conference contribution

Sponsorship: The authors wish to thank the CCR for the provision of computing facilities and AMI Fidelity USA for the financial support of S.S.H Wijayasuriya.

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Keywords

  • sliding window decorrelating algorithm
  • multi-user DS-CDMA systems

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    Wijayasuriya, SSH., Norton, GH., & McGeehan, JP. (1992). A near-far resistant algorithm to combat effects of fast fading in multi-user DS-CDMA systems. In International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC) (pp. 645 - 649). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/PIMRC.1992.279854