A new microscope for semiconductor luminescence studies

John C C Day, Peter S Aplin

Research output: Contribution to journalArticle (Academic Journal)peer-review

2 Citations (Scopus)

Abstract

A confocal scanning optical microscope is integrated with a helium cryostat to provide submicron spatial resolution of a specimen immersed in helium. Using gaseous or superfluid liquid helium, specimen temperature can be controlled from 300 to 2 K. Monochromatic illumination is provided and luminescence is analysed by conventional means. The specimen is scanned mechanically and its position relative to the focal point of the optical system is continously monitored by a capacitance displacement transducer and an optical system that senses light reflected from the specimen surface.
Original languageEnglish
Pages (from-to)329-331
Number of pages3
JournalMaterials Science and Engineering: B
Volume5
Issue number2
Publication statusPublished - Jan 1990

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