A new microscope for semiconductor luminescence studies

John C C Day; Peter S Aplin

A new microscope for semiconductor luminescence studies

Research output: Contribution to journal › Article (Academic Journal) › peer-review

2 Citations (Scopus)

Abstract

A confocal scanning optical microscope is integrated with a helium cryostat to provide submicron spatial resolution of a specimen immersed in helium. Using gaseous or superfluid liquid helium, specimen temperature can be controlled from 300 to 2 K. Monochromatic illumination is provided and luminescence is analysed by conventional means. The specimen is scanned mechanically and its position relative to the focal point of the optical system is continously monitored by a capacitance displacement transducer and an optical system that senses light reflected from the specimen surface.

Original language	English
Pages (from-to)	329-331
Number of pages	3
Journal	Materials Science and Engineering: B
Volume	5
Issue number	2
Publication status	Published - Jan 1990

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title = "A new microscope for semiconductor luminescence studies",

abstract = "A confocal scanning optical microscope is integrated with a helium cryostat to provide submicron spatial resolution of a specimen immersed in helium. Using gaseous or superfluid liquid helium, specimen temperature can be controlled from 300 to 2 K. Monochromatic illumination is provided and luminescence is analysed by conventional means. The specimen is scanned mechanically and its position relative to the focal point of the optical system is continously monitored by a capacitance displacement transducer and an optical system that senses light reflected from the specimen surface.",

author = "Day, {John C C} and Aplin, {Peter S}",

year = "1990",

month = jan,

language = "English",

volume = "5",

pages = "329--331",

journal = "Materials Science and Engineering: B",

issn = "0921-5107",

publisher = "Elsevier Sequoia",

number = "2",

}

TY - JOUR

T1 - A new microscope for semiconductor luminescence studies

AU - Day, John C C

AU - Aplin, Peter S

PY - 1990/1

Y1 - 1990/1

N2 - A confocal scanning optical microscope is integrated with a helium cryostat to provide submicron spatial resolution of a specimen immersed in helium. Using gaseous or superfluid liquid helium, specimen temperature can be controlled from 300 to 2 K. Monochromatic illumination is provided and luminescence is analysed by conventional means. The specimen is scanned mechanically and its position relative to the focal point of the optical system is continously monitored by a capacitance displacement transducer and an optical system that senses light reflected from the specimen surface.

AB - A confocal scanning optical microscope is integrated with a helium cryostat to provide submicron spatial resolution of a specimen immersed in helium. Using gaseous or superfluid liquid helium, specimen temperature can be controlled from 300 to 2 K. Monochromatic illumination is provided and luminescence is analysed by conventional means. The specimen is scanned mechanically and its position relative to the focal point of the optical system is continously monitored by a capacitance displacement transducer and an optical system that senses light reflected from the specimen surface.

M3 - Article (Academic Journal)

VL - 5

SP - 329

EP - 331

JO - Materials Science and Engineering: B

JF - Materials Science and Engineering: B

SN - 0921-5107

IS - 2

ER -