Abstract
A confocal scanning optical microscope is integrated with a helium cryostat to provide submicron spatial resolution of a specimen immersed in helium. Using gaseous or superfluid liquid helium, specimen temperature can be controlled from 300 to 2 K. Monochromatic illumination is provided and luminescence is analysed by conventional means. The specimen is scanned mechanically and its position relative to the focal point of the optical system is continously monitored by a capacitance displacement transducer and an optical system that senses light reflected from the specimen surface.
Original language | English |
---|---|
Pages (from-to) | 329-331 |
Number of pages | 3 |
Journal | Materials Science and Engineering: B |
Volume | 5 |
Issue number | 2 |
Publication status | Published - Jan 1990 |