A novel methodology for estimating tensile properties in a small punch test employing in-situ DIC based deflection mapping

V.D. Vijayanand*, Mehdi Mokhtarishirazabad, Jian Peng, Yiqiang Wang, Mike Gorley, David M Knowles, Mahmoud Mostafavi

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

16 Citations (Scopus)
191 Downloads (Pure)


Determining tensile properties from small punch test is being pursued actively in the nuclear industry due to the limited volume of material such tests use compared with standard tests which can be critical when considering active or development samples. One of the crucial challenges in harnessing the full potential of this technique is formulating methodologies which correlate the small punch specimen’s deflection to equivalent uniaxial tensile properties. Existing approaches for correlation rely on deflection obtained from a single point on the small punch test specimen, used with empirical equations to make the correlation. However, the deflection and strain accumulation in a small punch specimen is highly heterogeneous and data from a single point does not represent the gross deformation evolving in the specimen. This data when used in conjunction with the empirical formulations for deriving equivalent uniaxial tensile properties, would not result in accurate identification of material properties. In this work we offer an alternative approach which uses the full field deflection of the specimen mapped through in-situ digital image correlation. The use of digital image correlation combined with inverse finite element analysis augments the existing method of material properties identification from single point deflection data thereby significantly improving the reliability of the measurements.
Original languageEnglish
Article number152260
Number of pages14
JournalJournal of Nuclear Materials
Early online date1 Jun 2020
Publication statusE-pub ahead of print - 1 Jun 2020


  • Small punch testing
  • in-situ digital image correlation
  • deflection mapping
  • inverse finite element analysis
  • mechanical properties


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    Sadaf R Alam (Manager), Steven A Chapman (Manager), Polly E Eccleston (Other), Simon H Atack (Other) & D A G Williams (Manager)

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