A reflectometer for the combined measurement of refractive index, microroughness, macroroughness and gloss of low-extinction surfaces

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21 Citations (Scopus)

Translated title of the contribution	A reflectometer for the combined measurement of refractive index, microroughness, macroroughness and gloss of low-extinction surfaces
Original language	English
Publisher	IOP Publishing
Edition	20
DOIs	https://doi.org/10.1088/0957-0233/20/2/025309
Publication status	Published - 20 Jan 2009

Other: Measurement Science and Technology

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@misc{26d3a11682cb44709117e81861b980e8,

title = "A reflectometer for the combined measurement of refractive index, microroughness, macroroughness and gloss of low-extinction surfaces",

author = "NJ Elton and JCC Day",

note = "Other: Measurement Science and Technology",

year = "2009",

month = jan,

day = "20",

doi = "10.1088/0957-0233/20/2/025309",

language = "English",

publisher = "IOP Publishing",

address = "United Kingdom",

edition = "20",

}

TY - ADVS

T1 - A reflectometer for the combined measurement of refractive index, microroughness, macroroughness and gloss of low-extinction surfaces

AU - Elton, NJ

AU - Day, JCC

N1 - Other: Measurement Science and Technology

PY - 2009/1/20

Y1 - 2009/1/20

U2 - 10.1088/0957-0233/20/2/025309

DO - 10.1088/0957-0233/20/2/025309

M3 - Web publication/site

PB - IOP Publishing

ER -