TY - JOUR
T1 - A single-bit and double-adjacent error correcting parallel decoder for multiple-bit error correcting BCH codes
AU - Namba, Kazuteru
AU - Pontarelli, Salvatore
AU - Ottavi, Marco
AU - Lombardi, Fabrizio
PY - 2014/1/1
Y1 - 2014/1/1
N2 - This paper presents a novel high-speed BCH decoder that corrects double-adjacent and single-bit errors in parallel and serially corrects multiple-bit errors other than double-adjacent errors. Its operation is based on extending an existing parallel BCH decoder that can only correct single-bit errors and serially corrects double-adjacent errors at low speed. The proposed decoder is constructed by a novel design and is suitable for nanoscale memory systems, in which multiple-bit errors occur at a probability comparable to single-bit errors and double-adjacent errors occur at a higher probability (nearly two orders of magnitude) than other multiple-bit errors. Extensive simulation results are reported. Compared with the existing scheme, the area and delay time of the proposed decoder are on average 11% and 6% higher, but its power consumption is reduced by 9% on average. This paper also shows that the area, delay, and power overheads incurred by the proposed scheme are significantly lower than traditional fully parallelized BCH decoders capable of correcting any double-bit errors in parallel.
AB - This paper presents a novel high-speed BCH decoder that corrects double-adjacent and single-bit errors in parallel and serially corrects multiple-bit errors other than double-adjacent errors. Its operation is based on extending an existing parallel BCH decoder that can only correct single-bit errors and serially corrects double-adjacent errors at low speed. The proposed decoder is constructed by a novel design and is suitable for nanoscale memory systems, in which multiple-bit errors occur at a probability comparable to single-bit errors and double-adjacent errors occur at a higher probability (nearly two orders of magnitude) than other multiple-bit errors. Extensive simulation results are reported. Compared with the existing scheme, the area and delay time of the proposed decoder are on average 11% and 6% higher, but its power consumption is reduced by 9% on average. This paper also shows that the area, delay, and power overheads incurred by the proposed scheme are significantly lower than traditional fully parallelized BCH decoders capable of correcting any double-bit errors in parallel.
KW - BCH codes
KW - double-adjacent error correction (DAEC)
KW - Error correcting code (ECC)
KW - parallel decoder
UR - http://www.scopus.com/inward/record.url?scp=84902213725&partnerID=8YFLogxK
U2 - 10.1109/TDMR.2014.2309935
DO - 10.1109/TDMR.2014.2309935
M3 - Article (Academic Journal)
AN - SCOPUS:84902213725
SN - 1530-4388
VL - 14
SP - 664
EP - 671
JO - IEEE Transactions on Device and Materials Reliability
JF - IEEE Transactions on Device and Materials Reliability
IS - 2
M1 - 6757028
ER -