Abstract
This paper presents a novel high-speed BCH decoder that corrects double-adjacent and single-bit errors in parallel and serially corrects multiple-bit errors other than double-adjacent errors. Its operation is based on extending an existing parallel BCH decoder that can only correct single-bit errors and serially corrects double-adjacent errors at low speed. The proposed decoder is constructed by a novel design and is suitable for nanoscale memory systems, in which multiple-bit errors occur at a probability comparable to single-bit errors and double-adjacent errors occur at a higher probability (nearly two orders of magnitude) than other multiple-bit errors. Extensive simulation results are reported. Compared with the existing scheme, the area and delay time of the proposed decoder are on average 11% and 6% higher, but its power consumption is reduced by 9% on average. This paper also shows that the area, delay, and power overheads incurred by the proposed scheme are significantly lower than traditional fully parallelized BCH decoders capable of correcting any double-bit errors in parallel.
| Original language | English |
|---|---|
| Article number | 6757028 |
| Pages (from-to) | 664-671 |
| Number of pages | 8 |
| Journal | IEEE Transactions on Device and Materials Reliability |
| Volume | 14 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 1 Jan 2014 |
Keywords
- BCH codes
- double-adjacent error correction (DAEC)
- Error correcting code (ECC)
- parallel decoder
Fingerprint
Dive into the research topics of 'A single-bit and double-adjacent error correcting parallel decoder for multiple-bit error correcting BCH codes'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver