A small-angle x-ray scattering study of the interactions in concentrated silica colloidal dispersions

D Qiu, T Cosgrove, AM Howe, CA Dreiss

Research output: Contribution to journalArticle (Academic Journal)peer-review

19 Citations (Scopus)

Abstract

The structure factors of colloidal silica dispersions at rather high volume fractions (from 0.055 to 0.22) were measured by small-angle X-ray scattering and fitted with both the equivalent hard-sphere potential model (EHS) and the Hayter-Penfold/Yukawa potential model (HPY). Both of these models described the interactions in these dispersions successfully, and the results were in reasonable agreement. The strength and range of the interaction potentials decreased with increasing particle volume fractions, which suggests shrinkage of the electrical double layer arising from an increase in the counterion concentration in the bulk solution. However, the interactions at the average interparticle separation increased as the volume fraction increased. The interaction ranges () determined by the two models were very similar. Structure factors were also used to determine the size and volume fraction of the particles. The values of the size obtained from the structure factors were slightly larger than those obtained from the form factors; this difference is ascribed to the nonspherical shape and polydispersity of the colloidal particles. The volume fractions measured by these two methods were very similar and are both in good agreement with the independently measured results.
Translated title of the contributionA small-angle x-ray scattering study of the interactions in concentrated silica colloidal dispersions
Original languageEnglish
Pages (from-to)546 - 552
Number of pages7
JournalLangmuir
Volume22 (2)
DOIs
Publication statusPublished - Jan 2006

Bibliographical note

Publisher: American Chemical Society

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