A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode

Toshiaki Hatano, Kaiqiang Zhang, Said Khan, Thang Nguyen Tien, Guido Herrmann, C Edwards, Stuart Burgess, Mervyn Miles

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

2 Citations (Scopus)
204 Downloads (Pure)

Abstract

This paper presents results from the practical implementation of a specimen tracking controller for the transverse dynamic force microscope (TDFM). Uniquely, in the TDFM, the scanning cantilever is vertically oriented. It can be controlled in the vertical direction by piezo-actuation and the cantilever tip is excited in the horizontal direction at the resonance frequency of the cantilever beam. Once the cantilever tip approaches and interacts with a thin ordered water-layer usually found on any specimen at ambient conditions, the cantilever excitation amplitude changes. The extent of the changes depends on the vertical distance from the specimen surface, i.e. the amplitude level allows the detection of the distance between the cantilever-tip and the sample-substrate. Applying this relative height characteristic, a controller has been designed and implemented. This is based on a specially introduced amplitude detection scheme, a subsequent frequency-response based system identification, and a resulting controller design. The practical issues in developing this detection and control system are discussed. Experimental results prove that the presented relative height control method for specimen tracking is feasible and reliable.
Original languageEnglish
Title of host publication2016 American Control Conference (ACC 2016)
Subtitle of host publicationProceedings of a meeting held at July 6–8, Boston, MA, USA
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages7384-7389
Number of pages6
ISBN (Electronic)9781467386821
ISBN (Print)9781467386838
DOIs
Publication statusPublished - Oct 2016
Event2016 American Control Conference, ACC 2016 - Boston, United States
Duration: 6 Jul 20168 Jul 2016

Publication series

NameProceedings of the American Control Conference (ACC)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
ISSN (Print)0743-1619

Conference

Conference2016 American Control Conference, ACC 2016
CountryUnited States
CityBoston
Period6/07/168/07/16

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