A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode

Toshiaki Hatano; Kaiqiang Zhang; Said Khan; Thang Nguyen Tien; Guido Herrmann; C Edwards; Stuart Burgess; Mervyn Miles

doi:10.1109/ACC.2016.7526838

A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode

Toshiaki Hatano, Kaiqiang Zhang, Said Khan, Thang Nguyen Tien, Guido Herrmann, C Edwards, Stuart Burgess, Mervyn Miles

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

3 Citations (Scopus)

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Abstract

This paper presents results from the practical implementation of a specimen tracking controller for the transverse dynamic force microscope (TDFM). Uniquely, in the TDFM, the scanning cantilever is vertically oriented. It can be controlled in the vertical direction by piezo-actuation and the cantilever tip is excited in the horizontal direction at the resonance frequency of the cantilever beam. Once the cantilever tip approaches and interacts with a thin ordered water-layer usually found on any specimen at ambient conditions, the cantilever excitation amplitude changes. The extent of the changes depends on the vertical distance from the specimen surface, i.e. the amplitude level allows the detection of the distance between the cantilever-tip and the sample-substrate. Applying this relative height characteristic, a controller has been designed and implemented. This is based on a specially introduced amplitude detection scheme, a subsequent frequency-response based system identification, and a resulting controller design. The practical issues in developing this detection and control system are discussed. Experimental results prove that the presented relative height control method for specimen tracking is feasible and reliable.

Original language	English
Title of host publication	2016 American Control Conference (ACC 2016)
Subtitle of host publication	Proceedings of a meeting held at July 6–8, Boston, MA, USA
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	7384-7389
Number of pages	6
ISBN (Electronic)	9781467386821
ISBN (Print)	9781467386838
DOIs	https://doi.org/10.1109/ACC.2016.7526838
Publication status	Published - Oct 2016
Event	2016 American Control Conference, ACC 2016 - Boston, United States Duration: 6 Jul 2016 → 8 Jul 2016

Publication series

Name	Proceedings of the American Control Conference (ACC)
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
ISSN (Print)	0743-1619

Conference

Conference	2016 American Control Conference, ACC 2016
Country/Territory	United States
City	Boston
Period	6/07/16 → 8/07/16

Access to Document

10.1109/ACC.2016.7526838

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This is the accepted author manuscript (AAM). The final published version (version of record) is available online via IEEE at http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7526838. Please refer to any applicable terms of use of the publisher.
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Hatano, T., Zhang, K., Khan, S., Nguyen Tien, T., Herrmann, G., Edwards, C., Burgess, S., & Miles, M. (2016). A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode. In 2016 American Control Conference (ACC 2016): Proceedings of a meeting held at July 6–8, Boston, MA, USA (pp. 7384-7389). Article 7526838 (Proceedings of the American Control Conference (ACC)). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ACC.2016.7526838

Hatano, Toshiaki ; Zhang, Kaiqiang ; Khan, Said et al. / A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode. 2016 American Control Conference (ACC 2016): Proceedings of a meeting held at July 6–8, Boston, MA, USA. Institute of Electrical and Electronics Engineers (IEEE), 2016. pp. 7384-7389 (Proceedings of the American Control Conference (ACC)).

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title = "A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode",

abstract = "This paper presents results from the practical implementation of a specimen tracking controller for the transverse dynamic force microscope (TDFM). Uniquely, in the TDFM, the scanning cantilever is vertically oriented. It can be controlled in the vertical direction by piezo-actuation and the cantilever tip is excited in the horizontal direction at the resonance frequency of the cantilever beam. Once the cantilever tip approaches and interacts with a thin ordered water-layer usually found on any specimen at ambient conditions, the cantilever excitation amplitude changes. The extent of the changes depends on the vertical distance from the specimen surface, i.e. the amplitude level allows the detection of the distance between the cantilever-tip and the sample-substrate. Applying this relative height characteristic, a controller has been designed and implemented. This is based on a specially introduced amplitude detection scheme, a subsequent frequency-response based system identification, and a resulting controller design. The practical issues in developing this detection and control system are discussed. Experimental results prove that the presented relative height control method for specimen tracking is feasible and reliable.",

author = "Toshiaki Hatano and Kaiqiang Zhang and Said Khan and {Nguyen Tien}, Thang and Guido Herrmann and C Edwards and Stuart Burgess and Mervyn Miles",

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Hatano, T, Zhang, K, Khan, S, Nguyen Tien, T, Herrmann, G, Edwards, C, Burgess, S & Miles, M 2016, A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode. in 2016 American Control Conference (ACC 2016): Proceedings of a meeting held at July 6–8, Boston, MA, USA., 7526838, Proceedings of the American Control Conference (ACC), Institute of Electrical and Electronics Engineers (IEEE), pp. 7384-7389, 2016 American Control Conference, ACC 2016, Boston, United States, 6/07/16. https://doi.org/10.1109/ACC.2016.7526838

A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode. / Hatano, Toshiaki; Zhang, Kaiqiang; Khan, Said et al.
2016 American Control Conference (ACC 2016): Proceedings of a meeting held at July 6–8, Boston, MA, USA. Institute of Electrical and Electronics Engineers (IEEE), 2016. p. 7384-7389 7526838 (Proceedings of the American Control Conference (ACC)).

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

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T1 - A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode

AU - Hatano, Toshiaki

AU - Zhang, Kaiqiang

AU - Khan, Said

AU - Nguyen Tien, Thang

AU - Herrmann, Guido

AU - Edwards, C

AU - Burgess, Stuart

AU - Miles, Mervyn

PY - 2016/10

Y1 - 2016/10

N2 - This paper presents results from the practical implementation of a specimen tracking controller for the transverse dynamic force microscope (TDFM). Uniquely, in the TDFM, the scanning cantilever is vertically oriented. It can be controlled in the vertical direction by piezo-actuation and the cantilever tip is excited in the horizontal direction at the resonance frequency of the cantilever beam. Once the cantilever tip approaches and interacts with a thin ordered water-layer usually found on any specimen at ambient conditions, the cantilever excitation amplitude changes. The extent of the changes depends on the vertical distance from the specimen surface, i.e. the amplitude level allows the detection of the distance between the cantilever-tip and the sample-substrate. Applying this relative height characteristic, a controller has been designed and implemented. This is based on a specially introduced amplitude detection scheme, a subsequent frequency-response based system identification, and a resulting controller design. The practical issues in developing this detection and control system are discussed. Experimental results prove that the presented relative height control method for specimen tracking is feasible and reliable.

AB - This paper presents results from the practical implementation of a specimen tracking controller for the transverse dynamic force microscope (TDFM). Uniquely, in the TDFM, the scanning cantilever is vertically oriented. It can be controlled in the vertical direction by piezo-actuation and the cantilever tip is excited in the horizontal direction at the resonance frequency of the cantilever beam. Once the cantilever tip approaches and interacts with a thin ordered water-layer usually found on any specimen at ambient conditions, the cantilever excitation amplitude changes. The extent of the changes depends on the vertical distance from the specimen surface, i.e. the amplitude level allows the detection of the distance between the cantilever-tip and the sample-substrate. Applying this relative height characteristic, a controller has been designed and implemented. This is based on a specially introduced amplitude detection scheme, a subsequent frequency-response based system identification, and a resulting controller design. The practical issues in developing this detection and control system are discussed. Experimental results prove that the presented relative height control method for specimen tracking is feasible and reliable.

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SN - 9781467386838

T3 - Proceedings of the American Control Conference (ACC)

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EP - 7389

BT - 2016 American Control Conference (ACC 2016)

PB - Institute of Electrical and Electronics Engineers (IEEE)

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Y2 - 6 July 2016 through 8 July 2016

ER -

Hatano T, Zhang K, Khan S, Nguyen Tien T, Herrmann G, Edwards C et al. A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode. In 2016 American Control Conference (ACC 2016): Proceedings of a meeting held at July 6–8, Boston, MA, USA. Institute of Electrical and Electronics Engineers (IEEE). 2016. p. 7384-7389. 7526838. (Proceedings of the American Control Conference (ACC)). Epub 2016 Jul 28. doi: 10.1109/ACC.2016.7526838

A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode

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Robustness and adaptivity: advanced control and estimation algorithms for the transverse dynamic atomic force microscope

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A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode

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Robustness and adaptivity: advanced control and estimation algorithms for the transverse dynamic atomic force microscope

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