TY - JOUR
T1 - Advice on describing Bayesian analysis of neutron and X-ray reflectometry
AU - Mccluskey, Andrew R.
AU - Caruana, Andrew J.
AU - Kinane, Christy J.
AU - Armstrong, Alexander J.
AU - Arnold, Thomas
AU - Cooper, Joshaniel F.K.
AU - Cortie, David L.
AU - Hughes, Arwel V.
AU - Moulin, Jean Francois
AU - Nelson, Andrew R.J.
AU - Potrzebowski, Wojciech
AU - Starostin, Vladimir
N1 - Publisher Copyright:
© 2023 International Union of Crystallography. All rights reserved.
PY - 2023/2/1
Y1 - 2023/2/1
N2 - As a result of the availability of modern software and hardware, Bayesian analysis is becoming more popular in neutron and X-ray reflectometry analysis. The understandability and replicability of these analyses may be harmed by inconsistencies in how the probability distributions central to Bayesian methods are represented in the literature. Herein advice is provided on how to report the results of Bayesian analysis as applied to neutron and X-ray reflectometry. This includes the clear reporting of initial starting conditions, the prior probabilities, the results of any analysis and the posterior probabilities that are the Bayesian equivalent of the error bar, to enable replicability and improve understanding. It is believed that this advice, grounded in the authors' experience working in the field, will enable greater analytical reproducibility in the work of the reflectometry community, and improve the quality and usability of results.
AB - As a result of the availability of modern software and hardware, Bayesian analysis is becoming more popular in neutron and X-ray reflectometry analysis. The understandability and replicability of these analyses may be harmed by inconsistencies in how the probability distributions central to Bayesian methods are represented in the literature. Herein advice is provided on how to report the results of Bayesian analysis as applied to neutron and X-ray reflectometry. This includes the clear reporting of initial starting conditions, the prior probabilities, the results of any analysis and the posterior probabilities that are the Bayesian equivalent of the error bar, to enable replicability and improve understanding. It is believed that this advice, grounded in the authors' experience working in the field, will enable greater analytical reproducibility in the work of the reflectometry community, and improve the quality and usability of results.
KW - Bayesian analysis
KW - FAIR data standards
KW - reflectivity
KW - reflectometry
UR - http://www.scopus.com/inward/record.url?scp=85149413245&partnerID=8YFLogxK
U2 - 10.1107/S1600576722011426
DO - 10.1107/S1600576722011426
M3 - Article (Academic Journal)
C2 - 36777146
SN - 0021-8898
VL - 56
SP - 12
EP - 17
JO - Journal of Applied Crystallography
JF - Journal of Applied Crystallography
IS - 1
ER -