Abstract
This work quantifies the impact of microarchitectural features in modern high-performance Arm CPUs. To combat a parameter space that is too large to traverse naively, we employ a decision tree regression machine learning model to predict the number of execution cycles with 93.38% accuracy compared to the simulated cycles. We build on previous work by specializing our design to real-world HPC workloads and modernize our approach with updated search spaces, improved simulation frameworks, and over 180,000 simulated data points. We find empirically that vector length typically has the largest impact on HPC code performance at 25.91% of our performance weighting, followed by memory performance across all levels of the memory hierarchy, and the size of the reorder buffer and register files. Our results motivate deeper exploration of these parameters in both hardware design and simulation, as well as advancing the modelling of architectural simulation through the use of machine learning.
Original language | English |
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Title of host publication | Proceedings of SC 2024-W |
Subtitle of host publication | Workshops of the International Conference for High Performance Computing, Networking, Storage and Analysis |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 1455-1467 |
Number of pages | 13 |
ISBN (Electronic) | 9798350355543 |
ISBN (Print) | 9798350355550 |
DOIs | |
Publication status | Published - 8 Jan 2025 |
Event | 15th IEEE International Workshop on Performance Modeling, Benchmarking and Simulation of High Performance Computer Systems, PMBS 2024 - Atlanta, United States Duration: 18 Nov 2024 → 18 Nov 2024 https://pmbs-workshop.github.io/ |
Conference
Conference | 15th IEEE International Workshop on Performance Modeling, Benchmarking and Simulation of High Performance Computer Systems, PMBS 2024 |
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Abbreviated title | PMBS 2024 |
Country/Territory | United States |
City | Atlanta |
Period | 18/11/24 → 18/11/24 |
Internet address |
Bibliographical note
Publisher Copyright:© 2024 IEEE.