Translated title of the contribution | Algorithms for Rare Event Analysis in Nano-CMOS Circuits Using Statistical Blockade |
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Original language | English |
Title of host publication | Proceedings of the International SoC Design Conference (ISOCC) |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Publication status | Published - 2010 |
Bibliographical note
Other page information: -Conference Proceedings/Title of Journal: Proceedings of the International SoC Design Conference (ISOCC)
Other identifier: 2001399