Abstract
A method is developed to obtain the alloy scattering coefficients from first-principles band structure calculations. It is found that the scattering matrix can be decomposed into two additive components: a chemical part due to atomic substitution and a part due to ionic relaxation. The method is then applied to find the intra-and inter-valley electron scattering rates for substitutional carbon in silicon. Intravalley scattering is found to be the dominant process.
| Original language | English |
|---|---|
| Title of host publication | 2011 12th International Conference on Ultimate Integration on Silicon, ULIS 2011 |
| Pages | 99-102 |
| Number of pages | 4 |
| DOIs | |
| Publication status | Published - 2011 |
| Event | 2011 12th International Conference on Ultimate Integration on Silicon, ULIS 2011 - Cork, Ireland Duration: 14 Mar 2011 → 16 Mar 2011 |
Conference
| Conference | 2011 12th International Conference on Ultimate Integration on Silicon, ULIS 2011 |
|---|---|
| Country/Territory | Ireland |
| City | Cork |
| Period | 14/03/11 → 16/03/11 |
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