Original language | English |
---|---|
Title of host publication | Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on |
Pages | 232-237 |
Number of pages | 6 |
Publication status | Published - 2011 |
Alpha particle induced single-event error rates and scaling trends in commercial SRAM cells
I Chatterjee, BL Bhuva, S-J Wen, R Wong
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
3
Citations
(Scopus)