Alpha particle induced single-event error rates and scaling trends in commercial SRAM cells

I Chatterjee, BL Bhuva, S-J Wen, R Wong

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

3 Citations (Scopus)
Original languageEnglish
Title of host publicationRadiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Pages232-237
Number of pages6
Publication statusPublished - 2011

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