An enhanced modulated waveform measurement system for the robust characterization of microwave devices under modulated excitation

M Akmal; J Lees; V Carrubba; Z Yusoff; S Woodington; J Benedikt; PJ Tasker; S Ben Smida; KA Morris; MA Beach; JP McGeehan

An enhanced modulated waveform measurement system for the robust characterization of microwave devices under modulated excitation

M Akmal, J Lees, V Carrubba, Z Yusoff, S Woodington, J Benedikt, PJ Tasker, S Ben Smida, KA Morris, MA Beach, JP McGeehan

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

11 Citations (Scopus)

Translated title of the contribution	An enhanced modulated waveform measurement system for the robust characterization of microwave devices under modulated excitation
Original language	English
Title of host publication	IEEE 41st European Microwave Conference 2011, Manchester, UK
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Publication status	Published - Oct 2011

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Akmal, M., Lees, J., Carrubba, V., Yusoff, Z., Woodington, S., Benedikt, J., Tasker, PJ., Ben Smida, S., Morris, KA., Beach, MA., & McGeehan, JP. (2011). An enhanced modulated waveform measurement system for the robust characterization of microwave devices under modulated excitation. In IEEE 41st European Microwave Conference 2011, Manchester, UK Institute of Electrical and Electronics Engineers (IEEE).

@inproceedings{6ab199487ab94a83bd7ba77d39e17262,

title = "An enhanced modulated waveform measurement system for the robust characterization of microwave devices under modulated excitation",

author = "M Akmal and J Lees and V Carrubba and Z Yusoff and S Woodington and J Benedikt and PJ Tasker and {Ben Smida}, S and KA Morris and MA Beach and JP McGeehan",

year = "2011",

month = oct,

language = "English",

booktitle = "IEEE 41st European Microwave Conference 2011, Manchester, UK",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

}

Akmal, M, Lees, J, Carrubba, V, Yusoff, Z, Woodington, S, Benedikt, J, Tasker, PJ, Ben Smida, S, Morris, KA, Beach, MA & McGeehan, JP 2011, An enhanced modulated waveform measurement system for the robust characterization of microwave devices under modulated excitation. in IEEE 41st European Microwave Conference 2011, Manchester, UK. Institute of Electrical and Electronics Engineers (IEEE).

An enhanced modulated waveform measurement system for the robust characterization of microwave devices under modulated excitation. / Akmal, M; Lees, J; Carrubba, V et al.
IEEE 41st European Microwave Conference 2011, Manchester, UK. Institute of Electrical and Electronics Engineers (IEEE), 2011.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - An enhanced modulated waveform measurement system for the robust characterization of microwave devices under modulated excitation

AU - Akmal, M

AU - Lees, J

AU - Carrubba, V

AU - Yusoff, Z

AU - Woodington, S

AU - Benedikt, J

AU - Tasker, PJ

AU - Ben Smida, S

AU - Morris, KA

AU - Beach, MA

AU - McGeehan, JP

PY - 2011/10

Y1 - 2011/10

M3 - Conference Contribution (Conference Proceeding)

BT - IEEE 41st European Microwave Conference 2011, Manchester, UK

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -