An in-situ method of monitoring the surface area of porous silicon

LM Peter, DJ Riley, RI Wielgosz

Research output: Contribution to journalArticle (Academic Journal)peer-review

8 Citations (Scopus)
Translated title of the contributionAn in-situ method of monitoring the surface area of porous silicon
Original languageEnglish
Pages (from-to)61 - 64
JournalThin Solid Films
Volume276, No. 1-2
Publication statusPublished - 1996

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