An in-situ method of monitoring the surface area of porous silicon

LM Peter, DJ Riley, RI Wielgosz

Research output: Contribution to journal › Article (Academic Journal) › peer-review

8 Citations (Scopus)

Translated title of the contribution	An in-situ method of monitoring the surface area of porous silicon
Original language	English
Pages (from-to)	61 - 64
Journal	Thin Solid Films
Volume	276, No. 1-2
Publication status	Published - 1996

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