| Translated title of the contribution | Analysis of crystal defects by convergent beam electron diffraction techniques |
|---|---|
| Original language | English |
| Title of host publication | Unknown |
| Pages | 893 - 894 |
| Number of pages | 1 |
| Volume | 1 |
| Publication status | Published - 1994 |
Bibliographical note
Conference Proceedings/Title of Journal: Proc. 13th Int. Congress on Electron Microscopy, Paris 1994Cite this
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