Analysis of cyclic spontaneous switchings in GaN & SiC cascodes by snappy turn-off currents

Research output: Contribution to journal › Article (Academic Journal) › peer-review

Original language	English
Journal	Microelectronics Reliability
DOIs	https://doi.org/10.1016/j.microrel.2020.113752
Publication status	Published - Nov 2020

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@article{86a9580631934ce39924f3ed386397c4,

title = "Analysis of cyclic spontaneous switchings in GaN & SiC cascodes by snappy turn-off currents",

author = "Saeed Jahdi",

year = "2020",

month = nov,

doi = "10.1016/j.microrel.2020.113752",

language = "English",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

}

TY - JOUR

T1 - Analysis of cyclic spontaneous switchings in GaN & SiC cascodes by snappy turn-off currents

AU - Jahdi, Saeed

PY - 2020/11

Y1 - 2020/11

UR - http://dx.doi.org/10.1016/j.microrel.2020.113752

U2 - 10.1016/j.microrel.2020.113752

DO - 10.1016/j.microrel.2020.113752

M3 - Article (Academic Journal)

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

ER -