Analysis of losses in 2D photonic crystal waveguides using the 3D finite difference time domain (FDTD) method

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Abstract

The 3D FDTD method is used to obtain loss versus hole depth in a 2D photonic crystal waveguide by simulating two different length guides. The transmission results are validated against published measured data. Good agreement between measured and simulated data is obtained for a mini-stop band of the PC WG. Intrinsic loss has been extracted from different length guides and an estimate of the lower bound of waveguide loss has been made
Translated title of the contributionAnalysis of losses in 2D photonic crystal waveguides using the 3D finite difference time domain (FDTD) method
Original languageEnglish
Title of host publication2002 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society (LEOS 2002)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages516-517
Number of pages2
ISBN (Print)0780375009
DOIs
Publication statusPublished - Nov 2002
Event15th Annual Meeting of the IEEE Lasers and Electro-Optics Society - Glasgow, United Kingdom
Duration: 1 Nov 2002 → …

Conference

Conference15th Annual Meeting of the IEEE Lasers and Electro-Optics Society
CountryUnited Kingdom
CityGlasgow
Period1/11/02 → …

Bibliographical note

ISBN: 0780375009
Publisher: Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Name and Venue of Conference: 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2002 (LEOS 2002)
Rose publication type: Conference contribution

Terms of use: Copyright © 2002 IEEE. Reprinted from 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2002 (LEOS 2002).


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Keywords

  • 2D photonic crystal
  • Finite Difference Time Domain (FDTD)

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  • Cite this

    Cryan, MJ., Craddock, IJ., Yu, S., Railton, CJ., & Rorison, JM. (2002). Analysis of losses in 2D photonic crystal waveguides using the 3D finite difference time domain (FDTD) method. In 2002 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society (LEOS 2002) (pp. 516-517). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/LEOS.2002.1159408