Original language | English |
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Title of host publication | Reliability Physics Symposium (IRPS), 2010 IEEE International |
Pages | 1031-1035 |
Number of pages | 5 |
Publication status | Published - 2010 |
Analysis of soft error rates in combinational and sequential logic and implications of hardening for advanced technologies
NN Mahatme, I Chatterjee, BL Bhuva, J Ahlbin, LW Massengill, R Shuler
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
33
Citations
(Scopus)