Analysis of soft error rates in combinational and sequential logic and implications of hardening for advanced technologies

NN Mahatme, I Chatterjee, BL Bhuva, J Ahlbin, LW Massengill, R Shuler

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

32 Citations (Scopus)
Original languageEnglish
Title of host publicationReliability Physics Symposium (IRPS), 2010 IEEE International
Pages1031-1035
Number of pages5
Publication statusPublished - 2010

Cite this