Analysis of soft error rates in combinational and sequential logic and implications of hardening for advanced technologies

NN Mahatme, I Chatterjee, BL Bhuva, J Ahlbin, LW Massengill, R Shuler

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

33 Citations (Scopus)

Original language	English
Title of host publication	Reliability Physics Symposium (IRPS), 2010 IEEE International
Pages	1031-1035
Number of pages	5
Publication status	Published - 2010

Handle.net

@inproceedings{ae7343c38ee34eb6b19fb5e4812e0251,

title = "Analysis of soft error rates in combinational and sequential logic and implications of hardening for advanced technologies",

author = "NN Mahatme and I Chatterjee and BL Bhuva and J Ahlbin and LW Massengill and R Shuler",

year = "2010",

language = "English",

pages = "1031--1035",

booktitle = "Reliability Physics Symposium (IRPS), 2010 IEEE International",

}

TY - GEN

T1 - Analysis of soft error rates in combinational and sequential logic and implications of hardening for advanced technologies

AU - Mahatme, NN

AU - Chatterjee, I

AU - Bhuva, BL

AU - Ahlbin, J

AU - Massengill, LW

AU - Shuler, R

PY - 2010

Y1 - 2010

M3 - Conference Contribution (Conference Proceeding)

SP - 1031

EP - 1035

BT - Reliability Physics Symposium (IRPS), 2010 IEEE International

ER -