Analysis of ultrathin Ge layers in Si by large angle convergent beam electron diffraction

AA Hovsepian, D Cherns, W Jaeger

Research output: Contribution to journal › Article (Academic Journal) › peer-review

9 Citations (Scopus)

Translated title of the contribution	Analysis of ultrathin Ge layers in Si by large angle convergent beam electron diffraction
Original language	English
Pages (from-to)	1395 - 1410
Journal	Phil. Mag. A
Volume	79
Publication status	Published - 1999

Publisher: Taylor and Francis

Handle.net

@article{98208da6288a48d589e48e44e0ce70c9,

title = "Analysis of ultrathin Ge layers in Si by large angle convergent beam electron diffraction",

author = "AA Hovsepian and D Cherns and W Jaeger",

note = "Publisher: Taylor and Francis",

year = "1999",

language = "English",

volume = "79",

pages = "1395 -- 1410",

journal = "Phil. Mag. A",

issn = "1478-6435",

publisher = "Taylor & Francis Group",

}