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Analysis of ultrathin Ge layers in Si by large angle convergent beam electron diffraction

  • AA Hovsepian
  • , D Cherns
  • , W Jaeger

Research output: Contribution to journal › Article (Academic Journal) › peer-review

9 Citations (Scopus)
Translated title of the contributionAnalysis of ultrathin Ge layers in Si by large angle convergent beam electron diffraction
Original languageEnglish
Pages (from-to)1395 - 1410
JournalPhil. Mag. A
Volume79
Publication statusPublished - 1999

Bibliographical note

Publisher: Taylor and Francis

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