| Translated title of the contribution | Application of high spatial resolution electron diffraction techniques to the study of local properties of crystalline solids |
|---|---|
| Original language | English |
| Title of host publication | Determining nano-scale physical properties of materials by microscopy and spectroscopy |
| Editors | M. Sarikaya, M. Isaacson, H. K. Wickramasinghe |
| Publisher | MRS |
| ISBN (Print) | 155892316 |
| Publication status | Published - 1994 |
Bibliographical note
Other: MRS Publication Series, Volume 332Cite this
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