Applications of CBED and LACBED to the characterization of dislocations and stacking faults

JP Morniroli, JW Steeds

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

9 Citations (Scopus)

Translated title of the contribution	Applications of CBED and LACBED to the characterization of dislocations and stacking faults
Original language	English
Title of host publication	Unknown
Pages	417 - 420
Number of pages	3
Volume	119
Publication status	Published - 1991

Conference Proceedings/Title of Journal: Electron Microscopy & Analysis 1991
Other: # Vol. no. Inst. Phys. Conf. Ser. No. 119 (1991)

Handle.net

@inproceedings{b2a8caf6709945fba33ddc6fed5985e6,

title = "Applications of CBED and LACBED to the characterization of dislocations and stacking faults",

author = "JP Morniroli and JW Steeds",

note = "Conference Proceedings/Title of Journal: Electron Microscopy \& Analysis 1991 Other: \# Vol. no. Inst. Phys. Conf. Ser. No. 119 (1991)",

year = "1991",

language = "English",

isbn = "085494089",

volume = "119",

pages = "417 -- 420",

booktitle = "Unknown",

}

TY - GEN

T1 - Applications of CBED and LACBED to the characterization of dislocations and stacking faults

AU - Morniroli, JP

AU - Steeds, JW

N1 - Conference Proceedings/Title of Journal: Electron Microscopy & Analysis 1991 Other: # Vol. no. Inst. Phys. Conf. Ser. No. 119 (1991)

PY - 1991

Y1 - 1991

M3 - Conference Contribution (Conference Proceeding)

SN - 085494089

VL - 119

SP - 417

EP - 420

BT - Unknown

ER -