Applying grazing incidence x-ray reflectometry (XRR) to characterising nanofilms on mica

WH Briscoe, M Chen, IE Dunlop, J Penfold, J Klein, RMJ Jacobs

Research output: Contribution to journalArticle (Academic Journal)peer-review

37 Citations (Scopus)
Translated title of the contributionApplying grazing incidence x-ray reflectometry (XRR) to characterising nanofilms on mica
Original languageEnglish
Pages (from-to)459 - 463
Number of pages5
JournalJournal of Colloid and Interface Science
Volume306 (2)
DOIs
Publication statusPublished - Feb 2007

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