Are artefacts in scanning near-field optical microscopy related to the misuse of shear force?

RL Williamson, LJ Brereton, M Antognozzi, MJ Miles

Research output: Contribution to journalArticle (Academic Journal)peer-review

25 Citations (Scopus)
Translated title of the contributionAre artefacts in scanning near-field optical microscopy related to the misuse of shear force?
Original languageEnglish
Pages (from-to)165 - 175
JournalUltramicroscopy
Volume71
Publication statusPublished - 1998

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