| Translated title of the contribution | Automated materials characterization in electron microscopy |
|---|---|
| Original language | English |
| Title of host publication | Electron Microscopy 1998, Proc. of ICEM 14, Cancun, Mexico |
| Publisher | IOP Publishing |
| Pages | 29 - 32 |
| Volume | 1 |
| Publication status | Published - 1998 |
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